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Probe Microscopy Product List and Ranking from 6 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Probe Microscopy Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. ユニソク Osaka//Testing, Analysis and Measurement
  2. 生体分子計測研究所 Ibaraki//Testing, Analysis and Measurement
  3. セイコーフューチャークリエーション Chiba//Testing, Analysis and Measurement
  4. シエンタ オミクロン Tokyo//Testing, Analysis and Measurement
  5. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
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Probe Microscopy Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Ultra-high vacuum ultra-low temperature scanning probe microscope system USM1400 ユニソク
  2. Ultra-high vacuum ultra-low temperature scanning probe microscope system USM1200 ユニソク
  3. SPM Contract Measurement Services - Scanning Probe Microscope 生体分子計測研究所
  4. Data DL available: AFM Case Studies in Scanning Probe Microscopy セイコーフューチャークリエーション
  5. 4 Sienta Omicron Scanning Probe Microscope シエンタ オミクロン

Probe Microscopy Product List

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SPM Contract Measurement Services - Scanning Probe Microscope

SPM Contract Measurement Services - Scanning Probe Microscope

SPM Contract Measurement Services - Scanning Probe Microscope

Our company offers contract measurement services using state-of-the-art scanning probe microscopy (SPM) conducted by specialized staff. We visualize the surfaces of all types of samples at the nanoscale, ranging from biological samples such as cells, bacteria, proteins, and DNA to industrial materials like semiconductor substrates and polymers.

  • Other microscopes

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Ultra-high vacuum, ultra-low temperature, strong magnetic field scanning probe microscope system USM1300

Ultra-high vacuum, ultra-low temperature, strong magnetic field scanning probe microscope system USM1300

High-end model of ultra-low temperature and strong magnetic field STM! It is utilized both domestically and internationally, contributing to cutting-edge research in surface physics.

This is a high-performance STM that achieves the lowest reaching temperature and strong magnetic fields among commercially available products, actively contributing to the forefront of surface science research. It can be equipped with the necessary sample pretreatment systems tailored to research objectives. It is an essential research facility for cutting-edge superconductivity and low-temperature physics research.

  • Microscope
  • Analytical Equipment and Devices
  • others

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Ultra-High Vacuum Scanning Probe Microscope Unit ST100

Ultra-High Vacuum Scanning Probe Microscope Unit ST100

Super high vacuum room temperature SPM with excellent cost performance.

This is a scanning probe microscope (SPM) system capable of a wide range of applications such as STM, AFM, and SNOM in ultra-high vacuum (below 10^-8 Pa) and at room temperature. Its compact and simple structure, along with an excellent vibration isolation mechanism, makes high-resolution SPM measurements easy to achieve.

  • Microscope
  • Analytical Equipment and Devices

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Ultra-high vacuum, ultra-low temperature scanning probe microscope USM1500

Ultra-high vacuum, ultra-low temperature scanning probe microscope USM1500

A mid-range model of an ultra-low temperature strong magnetic field compatible SPM, compacted from the USM1300 type.

This is a new type of ultra-low temperature strong magnetic field SPM system with a low overall height, excellent operability, and cost performance. AFM measurements can also be supported as an option.

  • Analytical Equipment and Devices

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[Analysis Case] Evaluation of the Diffusion Layer Structure of Bipolar Transistors

[Analysis Case] Evaluation of the Diffusion Layer Structure of Bipolar Transistors

Clearly observable structure of the diffusion layer including pn junction determination.

It is possible to observe in detail from an overview of the NPN bipolar transistors within commercially available LSI to an enlarged view of the emitter section. This is an example where a cross-section passing through the center of the emitter electrode was exposed, and AFM observation and SCM measurement were conducted. By overlaying the AFM image, the positional relationship with the wiring becomes clear.

  • Contract Analysis

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CIQTEK Scanning NV Microscope

CIQTEK Scanning NV Microscope

CIQTEK CIQTEK Scanning NV Microscope

CIQTEK QDAFM - Diamond III is a magnetic imaging device that combines the diamond NV center with AFM imaging technology. Through quantum control and spin detection using a diamond probe, the magnetic properties of samples can be obtained quantitatively and non-invasively. With nanoscale spatial resolution and ultra-high detection sensitivity, QDAFM is an innovative technology for researching and developing magnetic textures, high-density magnetic storage, and spintronics. The magnetic imaging technology enabled by quantum probes equipped with diamond NV centers provides a new means of measuring magnetic fields with high spatial resolution and excellent sensitivity. This scanning NV center magnetometer not only scans magnetic materials but also extends its applications to important areas such as the study of mechanisms in biomolecules, life sciences, healthcare diagnostics, and disease treatment.

  • Electron microscope
  • Other microscopes
  • Other measurement, recording and measuring instruments

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Ultra-high vacuum ultra-low temperature scanning probe microscope system USM1400

Ultra-high vacuum ultra-low temperature scanning probe microscope system USM1400

Ultra-high vacuum ultra-low temperature SPM with high scalability, expandable to near-field optical/Raman spectroscopy.

This device adopts a newly developed cryostat and is a state-of-the-art low-temperature SPM system equipped with STM and AFM functions, which can be used for entirely new applications such as near-field optical measurements and Raman spectroscopy.

  • Microscope
  • Analytical Equipment and Devices
  • others

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Ultra-high vacuum ultra-low temperature scanning probe microscope system USM1200

Ultra-high vacuum ultra-low temperature scanning probe microscope system USM1200

✔ More than 10 days of LHe storage, continuous STM measurement, ✔ 1 day, less than 1 liter of LHe consumption

Sample pretreatment and probe cleaning are performed in ultra-high vacuum, allowing STM and AFM to observe with atomic and molecular level resolution at ultra-low temperatures. We are equipped with new probes and auxiliary devices to accommodate the expanding range of applications in recent years.

  • Microscope
  • Analytical Equipment and Devices

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Data DL available: AFM Case Studies in Scanning Probe Microscopy

Data DL available: AFM Case Studies in Scanning Probe Microscopy

We will introduce numerous analysis cases using AFM scanning probe microscopy, such as structural analysis, elastic modulus measurement, and conductivity measurement.

In this case study collection, we will introduce analysis examples using "AFM: Scanning Probe Microscopy." [Contents] ● Method and results of "Structural analysis and elastic modulus measurement of food (somen)" ● Features and analysis examples of "Conductive measurements of AFM in a vacuum" ● Features and analysis examples of "Conductivity evaluation of material surfaces using AFM" ● "AFM observation of polymer materials (smoothing by microtome)" We conduct various analyses using AFM, which is one of our strengths. We hope you will take a look. There are many other examples not included here. *For more details, please refer to our other PDF materials or feel free to contact us.

  • Other microscopes
  • Contract Analysis
  • Surface treatment contract service

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[Data Download Available] Smoothing of Polymer Materials by Microtome and AFM Observation

[Data Download Available] Smoothing of Polymer Materials by Microtome and AFM Observation

High-resolution observation of soft polymer materials is possible with a cryo-microtome and AFM.

AFM scanning probe microscopy is a device that detects various physical interactions occurring between a probe and the sample surface, allowing for the observation of surface morphology in small areas and the measurement of electrical and mechanical properties. These physical interactions include atomic force, frictional force, and electrostatic force. It can perform measurements in various environments, including atmospheric and vacuum conditions, and is capable of observing sample surfaces regardless of whether they are conductive or insulating. Additionally, by using a cryo-microtome, it is possible to produce ultra-thin sections of soft polymer materials such as resins under frozen conditions. We are observing polyisoprene rubber from various angles using this AFM and cryo-microtome. Please take a moment to read the PDF materials. This technology can be applied not only to rubber but also to resins, plastics, and various polymer materials. Furthermore, our company conducts various surface analyses, including XPS, AES, and GD-OES, in addition to this analytical device. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.

  • Other polymer materials
  • Contract Analysis
  • Rubber

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Sienta Omicron Scanning Probe Microscope

Sienta Omicron Scanning Probe Microscope

We offer a wide variety of microscopes tailored to meet our customers' needs.

When selecting an Omicron microscope, please consider "temperature" and "function." "Temperature" refers to the temperature of the sample being observed. You need to determine whether the sample temperature can be at room temperature, or if it needs to be cooled or heated. Depending on these requirements, the microscopes come equipped with different basic options. "Function" refers to whether you only need a Scanning Tunneling Microscope (STM) or if you need to include an Atomic Force Microscope (AFM). This functionality cannot be upgraded (modified or altered) after delivery; you will have to maintain the initial functionality. While we offer a wide range of options, please note that we do not provide options that change the basic performance. For more details, please contact us or refer to the catalog.

  • Other microscopes

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ARCTIC SPM Lab

ARCTIC SPM Lab

New type low-temperature scanning probe microscope

Redefining Low-Temperature SPM: A Closed-Cycle System Equipped with High Magnetic Field and Optical System Experience a new type of low-temperature scanning probe microscope with precision, efficiency, and adaptability. The ARCTIC SPM Lab features continuous operation, a compact footprint, and modular expandability to meet evolving research needs. Closed-cycle cooling technology enables a sustainable and cost-effective approach, eliminating dependence on helium. The SPM maintains excellent mechanical stability while providing virtually unlimited measurement time.

  • Other microscopes

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