High-resolution observation of soft polymer materials is possible with a cryo-microtome and AFM.
AFM scanning probe microscopy is a device that detects various physical interactions occurring between a probe and the sample surface, allowing for the observation of surface morphology in small areas and the measurement of electrical and mechanical properties. These physical interactions include atomic force, frictional force, and electrostatic force. It can perform measurements in various environments, including atmospheric and vacuum conditions, and is capable of observing sample surfaces regardless of whether they are conductive or insulating.
Additionally, by using a cryo-microtome, it is possible to produce ultra-thin sections of soft polymer materials such as resins under frozen conditions. We are observing polyisoprene rubber from various angles using this AFM and cryo-microtome.
Please take a moment to read the PDF materials.
This technology can be applied not only to rubber but also to resins, plastics, and various polymer materials.
Furthermore, our company conducts various surface analyses, including XPS, AES, and GD-OES, in addition to this analytical device.
We would be happy to assist you, so please feel free to reach out.
Seiko Future Creation Official Website
https://www.seiko-sfc.co.jp/
*Other materials are also available. If you request through the inquiry button, we will send them to you.